Suzhou Takchip Semiconductor Co., Ltd.
TKP-V Series

Flatness Measurement Equipment TKP-V Series
· New optical module, suitable for products with significant warping following thinning, debonding or coating
· Compatible with manual and automated loading/unloading and sorting systems
· Supports detailed analysis or rapid comprehensive inspection

Flatness Measurement Equipment TKP-V Series

New optical module, suitable for products with significant warping following thinning, debonding or coating.

Compatible with manual and automated loading/unloading and sorting systems.

Supports detailed analysis or rapid comprehensive inspection.

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UniDRON-Semi Technology


TKP-V Series  Specification Sheet

Sample Size

4/6 or 6/8 or 8/12 inches

 Test specimen material

Si/SiC/GaAs/GaN/InP/Glass/Sapphire etc

Test range

100–300 mm

Workpiece warpage

>5 mm, (25°)

External dimensions

1350 × 1800 × 1900 mm

Measurement functions

TTV, LTV, BOW, WARP, Thickness, Stress

Vibration isolation system

Suspension-type vibration isolation system, air-cushion type

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